Bypass diode testing system
Meets standard:
IEC61215-2 MQT18
IEC61730-2 MST 25
Test objective:
To evaluate the thermal performance of bypass diodes and their long-term reliability in dealing with harmful effects such as hot spots.
Product Features:
-The system automatically forms a fitting curve and determines the test results
-The equipment is equipped with an oscilloscope to capture pulse curves
Collection channel
Voltage acquisition: 8 channels
Temperature acquisition: 8 channels